10V/500mA Four-channel Sub Card DC Source Measure Unit CS401

      The CS400 is a modular SMU solution engineered for high-volume device testing, featuring an innovative common-ground architecture with 4 channels per subcard. When integrated with the CS1010C host system, it achieves synchronized control of up to 40 channels—reducing system integration costs by 50% compared to traditional single-channel instruments. Optimized for high-throughput applications including LED/OLED production-line aging tests and semiconductor wafer multi-probe parallel inspection.

Product Features

▪ ±0.1% Basic Accuracy: Maintains precision across full ranges in both sourcing and sinking modes.

▪ Multi-functional Operation: Combines voltage/current sourcing, voltmeter/ammeter, and electronic load capabilities.

▪ Programmable Trigger I/O: Configurable trigger polarity (rising/falling edge) for automated test sequencing.

▪ Independent Channel Control: Each channel operates autonomously for mixed-device testing scenarios.

▪ Space-efficient Design: Compact modular architecture maximizes rack density in production environments.

▪SCPI Compatibility: Standard command set enables seamless integration with LabVIEW/Python automation frameworks.

Product Parameters

Applications

▪ Semiconductor Device Testing:Static/dynamic parameter analysis of discrete devices (MOSFETs, diodes, BJTs).

▪ Nanomaterials & Organic Electronics:Resistivity and Hall-effect testing for graphene, nanowires, and e-ink materials.

▪ Energy Device Evaluation:Efficiency testing and I-V curve scanning for solar cells, DC-DC converters, and batteries.

▪ Sensor Calibration:Sensitivity and response characterization of gas-sensitive/pressure-sensitive resistors and temperature sensors.

▪ Multi-channel Parallel Testing:LED/AMOLED panel aging tests and high-volume production QA for multi-device batch validation.