10V 500mA PXI Source Measure Unit Sub Card Pulse PXI SMU Unit CBI401
10V 500mA PXI Source Measure Unit Sub Card Pulse PXI SMU Unit CBI401
The CBI401 modular subcard is a core component of the CS Series precision digital Source-Measure Units (SMUs), designed for medium-to-low power multi-channel electrical characterization. Featuring a single-card quad-channel common-ground architecture, each channel operates independently or synchronously, ideal for high-density parallel testing. Compatible with Pusces 1003CS (3-slot) and 1010CS (10-slot) hosts, it leverages a 3Gbps backplane bandwidth and 16-channel trigger bus to enable high-speed multi-device coordination. Optimized for low-noise, high-stability batch testing, it delivers up to 500mA current, 10V voltage, and 5W power per channel, addressing precision testing needs in semiconductors, sensors, and micro-power devices.
Product Features
▪ High-Density Multi-channel Design:Integrates 4 independent channels per subcard for parallel device testing.
▪ Synchronized Operation:Hardware-triggered synchronization across channels ensures μs-level timing accuracy.
▪ Precision & Low Noise:0.1% sourcing/measurement accuracy with 5½-digit resolution; current measurement down to 5μA, voltage range 10mV–10V.
▪ Four-Quadrant Operation:Simulates power supply or electronic load behavior in sourcing/sinking modes.
▪ Dual Mode Flexibility:Supports both pulsed and DC testing protocols for dynamic characterization.
▪ Scalable Architecture:Seamless integration with CS-series hosts for system expansion up to 40 channels.
Product Parameters
|
Items |
Parameters |
|
Number of Channels |
4 channels |
|
Voltage Range |
±10V |
|
Minimum Voltage Resolution |
1mV |
|
Current Range |
2mA～500mA |
|
Minimum Current Resolution |
200nA |
|
Minimum Pulse Width |
100μs, maximum duty cycle 100% |
|
Programmable Pulse Width Resolution |
1μs |
|
Maximum Continuous Wave (CW) Output Power |
5W, 4-quadrant source or sink mode |
|
Maximum Pulse (PW) Output Power |
5W, 4-quadrant source or sink mode |
|
Stable Load Capacitance |
<22nF |
|
Broadband Noise (20MHz) |
2mV RMS (typical value), <20mV Vp-p (typical value) |
|
Maximum Sampling Rate |
1000 S/s |
|
Source Measurement Accuracy |
0.10% |
|
Hosts it is Compatible with |
1003C,1010C |
Applications
▪ Discrete semiconductor device characteristics test,including resistors, diodes,light-emitting diodes,Zener diodes,PIN diodes,BJT transistors,MOSFETs,SIC,GaN and other devices;
▪ Energy and efficiency tests,including LED/AMOLED,solar cells,DC-DC converters,etc.;
▪ Sensor characteristic test,including resistivity,Hall effect,etc.;
▪ Organic materials characteristic test,including electronic ink,printed electronic technology,etc.;
▪ Nanomaterials characteristics test,including graphene,nanowires,etc.
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