National Instruments PXIe-4143 PXI Source Measure Unit with 4 SMU Channels, 24V Range and 1A Output
Price:
$10,000/sets >=1 sets
MOQ:
one
Delivery Time:
Delivery time for minimum order quantity ≤ 30 days
Brand:
National Instruments
Product Description
Product Overview
The National Instruments PXIe-4143 PXI Source Measure Unit (SMU) integrates versatile channels capable of delivering current or voltage with 16-bit setpoint and measurement resolution. This high-performance module combines source and measurement capabilities in a compact PXI Express form factor.
Key Features
- Integrated tool channel with 16-bit resolution for precise current or voltage output
- Can provide up to 6 V and 1 A as supplementary power source
- Supports transistor characterization tests requiring constant current/voltage during scans
- Space-efficient solution with up to 17 modules in a single PXI chassis (17 SMU channels + 17 programmable power channels in 4U space)
- Dual-mode operation: constant voltage source or constant current source with adjustable compliance limits
- Remote sensing capability for improved measurement accuracy in high-precision applications
- Advanced measurement algorithms for different DUT impedance conditions
Technical Specifications
| Parameter | Specification |
|---|---|
| Part Number | 782431-01 |
| Current Sensitivity | 10 pA |
| SMU Channels | 4 |
| Voltage Range | -24 V to 24 V |
| SourceAdapt Technology | Yes |
| Max DC Sink Power | 3.6 W |
| Max DC Source Power | 3.6 W |
| DC Current Range | -150 mA to 150 mA |
| Bus Connector | PXI Express |
Measurement Methodology
The PXIe-4143 SMU employs intelligent measurement strategies based on device characteristics. For low-resistance DUTs, it applies current stimulus followed by voltage response measurement. For high-impedance DUTs, it uses voltage stimulus followed by current response measurement.
Application Benefits
- Significant space and cost savings compared to traditional test solutions
- Ideal for parallel test applications requiring multiple SMU channels
- Enhanced measurement accuracy with remote sensing capability
- Flexible configuration for various semiconductor test requirements
Similar Products
Get in Touch
Have questions about our products or want to discuss a custom order? Our team is ready to help you.
Company
Shenzhen Jinxi Boyuan Technology Co., Ltd.
Location
China Guangdong SHENZHEN 401, Building C, Xumei Zhichuang Park, No. 130 Pingji Avenue, Pinghu, Longgang District
Contact Person
ALEXLEE