Electronic Equipment Crystal Oscillator 26 Megahertz Frequency HD 83026000301 with SMD 3.2x2.5 Package

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Price: Negotiable

MOQ: Negotiable

Delivery Time: Negotiable

Product Description

Product Overview

This specification applies to the RoHS crystal oscillator with a frequency of 26.000 MHz, designed for use in electronic equipment. It features a SMD 3.2x2.5 package and CMOS output waveform, with a frequency stability of 50ppm and an operating temperature range of -40 to +85C. The oscillator is suitable for general electronic applications and is not recommended for safety-critical applications.

Product Attributes

Brand: JIANGSU HD-CRYSTAL TECHNOLOGY CO., LTD
Origin: China
Certifications: RoHS

Technical Specifications

Item	Specification	Nominal Frequency	Frequency Stability	Aging	Operating Temperature Range	Storage Temperature Range	Input Voltage (VDD)	Input Current (IDD)	Output Waveform	Output Symmetry	Rise/Fall Time	Output Voltage VOL:VOH	Output Load	Output State Control	Start-up Time	Standby Current	Phase Jitter (rms)	Oscillation Mode
SMD 3.2x2.5 XO	SMD3225-4 Crystal Oscillator	26.000 MHz	50ppm (incl. 25C tolerance, tolerance over operating temperature range, input voltage change, load change, 1 year aging)	3ppm/year	-40 to +85C	-55 to +125C	+3.3Vdc10%	10mA max	CMOS	5010%	8ns max	10%VDD 90%VDD	15pF	Enable/disable	510ms max	10A max	1ps rms max (12kHz to 20MHz)	Fundamental

Reliability Specifications

Item	Test Method	Specification	Procedure
Low Temperature Storage	GB/T 2423.1-2001, Method Aa	Frequency change after test 5ppm.	Spending 72 hrs at -55C3C constant temperature. Measurement taken after DUT being left at room temperature for 242 hours.
Humidity	GB/T 2423.3- 2006, Method Cab	Frequency change after test 5ppm.	Spending 96 hrs at 40 C 3 C, with 90 3% R.H. Measurement taken after DUT being left at room temperature for 242 hours.
High Temperature Storage	GB/T 2423.2-2001, Method Ba	Frequency change after test 5ppm.	Spending 72 hrs at 125C3C constant temperature. Measurement taken after DUT being left at room temperature for 242 hours.
Temperature Cycle	GB/T 2423.22-2002, Method Nb	Frequency change after test 5ppm.	10 cycles from -55C to 125C. Measurement taken after DUT being left at room temperature for 242 hours.
Vibration	GB/T 2423.10- 1995, Method Fc	Frequency change after test 5ppm.	Apply 0.75mm vibration at sweep frequency 10500 Hz, for 2h. 10 cycles in each direction of 3 axis. Measurement taken after 1 hour.
Shock	GB/T 2423.5-1995, Method Ea	Frequency change after test 5ppm.	Peak 1000m/s2, normal width 6ms half sine wave form, 3.7m/s, 3 perpendicular axis of samples, 3 cycles / direction, total 18 cycles. Measurement taken after 1 hour.
Solderability	GB/T 2423.28-2005, Method Tc	Terminals shall be covered more then 95% with solder.	In 245 5 solder bath for 2 0.5 seconds. There is no need to do functioned test.
Resistance to Soldering Heat	GB/T 2423.28-2005, Test Tb Method 1B	Frequency change after test 5ppm. No visible damages.	Passed through the re-flow oven under the following condition. Preheat to 150C5C for 60 to 120sec,and peak 265C5C for 10s3sec.Measurement taken after DUT being left at room temperature for at 242 hours.
Drop	GB/T 2423.8-1995, Method Ed	No visible damages.	Free drop to the wooden plate from 1.0 m heights for 3 times.
Terminal Strength	JIS-C- 6429 Method 1 & 2	No visible damage	Mount on a glass-epoxy board (100x50x1.6mm), then bend to 2mm displacement (velocity 1mm/sec) and keep for 5 seconds. or pulling force 0.5 kg for at least 60 seconds. 8-12X magnifier.