Electronic component GLE GCNR5040-3R3NC with 3.3 microhenry inductance and current specifications

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Product Description

Product Overview

The GCNR5040 GLE series is a type of electronic component manufactured by Shenzhen Glorious Electronic Co.,Ltd. It is designed for various applications requiring specific inductance and current handling capabilities. The product adheres to RoHS compliance.

Product Attributes

Brand: GLE
Origin: China
Certifications: RoHS Comp.

Technical Specifications

Type	Part NO.	Inductance Lo (uH)	Test Frequency (Hz/v)	DC Resistance (m) 30%	Saturated Current Isat (A) Max. (L/L-35%)	Temperature Rise Current Irms (A) Max. (T40)	Inductance Tolerance
GCNR5040	GCNR5040-1R0M	1.0	100KHz/1v	12	7.35	4.90	M = 20%
GCNR5040	GCNR5040-1R5M	1.5	100KHz/1v	15	6.30	4.30	M = 20%
GCNR5040	GCNR5040-2R2M	2.2	100KHz/1v	19	4.90	3.80	M = 20%
GCNR5040	GCNR5040-3R3M	3.3	100KHz/1v	24	3.95	3.40	M = 20%
GCNR5040	GCNR5040-4R7M	4.7	100KHz/1v	30	3.50	3.00	M = 20%
GCNR5040	GCNR5040-6R8M	6.8	100KHz/1v	43	2.75	2.50	M = 20%
GCNR5040	GCNR5040-100M	10	100KHz/1v	64	2.35	2.10	M = 20%
GCNR5040	GCNR5040-150M	15	100KHz/1v	86	2.00	1.95	M = 20%
GCNR5040	GCNR5040-220M	22	100KHz/1v	129	1.60	1.50	M = 20%
GCNR5040	GCNR5040-330M	33	100KHz/1v	188	1.30	1.20	M = 20%
GCNR5040	GCNR5040-470M	47	100KHz/1v	272	1.10	1.00	M = 20%
GCNR5040	GCNR5040-680M	68	100KHz/1v	400	0.90	0.80	M = 20%
GCNR5040	GCNR5040-101M	100	100KHz/1v	560	0.75	0.70	M = 20%

General Specifications

Item	Specification	Condition
Terminal Strength	No electrode detachment should be found	When the device is pushed in two directions of X and Z with the force of 5N for 102seconds after soldering between copper plate and the electrodes
Reflow test	Change from an initial value L : within20%	Peak temp 2405 3010s. The specimen shall be subjected to the reflow process under the above condition 2 times. Test board shall be 0.8mm thick. Base material shall be glass epoxy resin. Measurement shall be made after storing at standard atmospheric conditions for 1 h.
Vibration	Change from an initial value L : within20%	The specimen shall be subjected to a vibration of 1.5mm amplitude, sweep frequency 10~55~10Hz after vibration for 1 hours.
Free fall test	Change from an initial value L : within20%	The specimen must be fixed on test board. Then it shall be fallen freely from 1m height. 10 consecutive times.
High temperature and high humidity test	Change from an initial value L : within20%	The specimen shall be stored at a temperature of 402 with relative humidity of 90 ~ 95% for 96 4h. Then it shall be stabilized under standard atmospheric conditions for 1 h before measurement. Measurement shall be made within 1h~ 2h.
High temperature preservation test	Change from an initial value L : within20%	The specimen shall be stored at a temperature of 1252for 96 1h. Then it shall be stabilized under standard atmospheric conditions for 1 h before measurement. Measurement shall be made within 1h~ 2h.
Low temperature preservation test	Change from an initial value L : within20%	After stored at a temperature of -40 3 for 96 1h. The specimen should be measured, then it should be measured under normal temperature and humidity in 1h~ 2h hours.
Solder ability test	New solder shall cover 95% minimum of the surface immersed.	Terminals shall be immersed in flux at room temperature. Dip sample into solder bath containing molten solder at 2605for 30.5 seconds.
Cold and hot cycle test	Change from an initial value L : within20%	The specimen shall be measured after 20 continuous cycles of temperature change of -403for 30 min and 1252 for 30 min with the transit period of 2min or less. Then it shall be stabilized under standard atmospheric conditions for 1 h before measurement. Measurement shall be made within 1h~ 2h.
Storage temperature and humidity range	temperature range 535 humidity range 25%80%	In packing state.