Chip multilayer ceramic capacitors muRata GRM155R60J475ME87D designed for in general electronic devices

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Product Description

Product Overview

Chip Multilayer Ceramic Capacitors for General Electronic Equipment. Designed for general-purpose applications, these capacitors offer reliable performance and are suitable for a wide range of electronic devices.

Product Attributes

Brand: MURATA

Technical Specifications

Part Number	Size Code	Temperature Characteristics	Nominal Capacitance	Capacitance Tolerance	Rated Voltage	Packaging	Packaging Code	Dimensions (L/W)	Dimensions (T)
GRM155R60J475ME87	0402	X5R (EIA)	4.7uF	+/-20%	DC 6.3 V	10000 pcs./Reel	D	0.4	0.3
GRM155R60J475ME87	0402	X5R (EIA)	4.7uF	+/-20%	DC 6.3 V	40000 pcs./Reel	J	0.4	0.3

Item	Specification	Test Method
Rated Voltage	Defined as the maximum voltage which may be applied continuously to the capacitor.	Shown in Rated value.
Appearance	No defects or abnormalities.	Visual inspection.
Dimension	Shown in Rated value.	Using Measuring instrument of dimension.
Voltage Proof	No defects or abnormalities.	Measurement Point : Between the terminations Test Voltage : 250% of the rated voltage Applied Time : 1s to 5s Charge/Discharge Current : 50mA max.
Insulation Resistance(I.R.)	More than 50F	Measurement Temperature:Room Temperature Measurement Point : Between the terminations Measurement Voltage : Rated Voltage Charging Time : 1min Charge/Discharge Current : 50mA max.
Capacitance	Shown in Rated value.	Measurement Temperature:Room Temperature Measurement Frequency : 1.0+/-0.1kHz Measurement Voltage : 0.5+/-0.1Vrms
Q or Dissipation Factor (D.F.)	DF:0.1 max.	Measurement Temperature : Room Temperature Measurement Frequency : 1.0+/-0.1kHz Measurement Voltage : 0.5+/-0.1Vrms
Capacitance Change (Temperature Characteristics)	Within +/-15%	Measurement Temperature: Room Temperature Measurement Voltage : Less than 1.0Vrms (Refer to the individual data sheet) Pre-treatment : Perform a heat treatment at 150+0/-10C for 1hour and then let sit for 24+/-2hours at room temperature, then measure.
Adhesive Strength	No removal of the terminations or other defect should occur.	Solder the capacitor on the test substrate shown in Fig.3. Termination Applied Force : 5N Holding Time : 10+/-1 Applied Direction : In parallel with the test substrate and vertical with the capacitor side
Vibration	Appearance: No defects or abnormalities. Capacitance: Within the specified initial value. Q or D.F.: Within the specified initial value.	Solder the capacitor on the test substrate shown in Fig.3. Kind of Vibration : A simple harmonic motion 10Hz to 55Hz to 10Hz Vibration Time : 1min Total Amplitude : 1.5mm This motion should be applied for a period of 2hours in each 3 mutually perpendicular directions(total of 6hours).
Substrate Bending Test	Appearance: No defects or abnormalities. Capacitance: Within +/-10%	Solder the capacitor on the test substrate shown in Fig.1. Pressurization Method : Shown in Fig.2. Flexure : 1mm Change Holding Time : 5+/-1s Soldering Method : Reflow soldering
Solderability	95% of the terminations is to be soldered evenly and continuously.	Solder bath method Flux : Solution of rosin ethanol 25(mass)% Preheat : 80 to 12010s to 30s Solder : Sn-3.0Ag-0.5Cu(Lead Free Solder) Test Temp. : 245+/-5 Test Time : 2+/-0.5s
Resistance to Soldering Heat	Appearance: No defects or abnormalities. Capacitance: Within +/-15% Change Q or D.F.: Within the specified initial value. I.R.: Within the specified initial value. Voltage Proof: No defects.	Solder bath method Solder : Sn-3.0Ag-0.5Cu(Lead Free Solder) Solder Temp. : 270+/-5 Test Time : 10+/-0.5s Preheat Temp. : 120 to 150 Preheat Time : 1min I.R. Pre-treatment : Perform a heat treatment at 150+0/-10C for 1hour and then let sit for 24+/-2hours at room temperature, then measure. Post-treatment : Let sit for 24+/-2hours at room temperature, then measure. Voltage Proof Post-treatment : Let sit for 24+/-2hours at room temperature, then measure.
Temperature Sudden Change	Appearance: No defects or abnormalities. Capacitance: Within +/-7.5% Change Q or D.F.: Within the specified initial value. I.R.: Within the specified initial value. Voltage Proof: No defects.	Solder the capacitor on the test substrate shown in Fig.3. Sudden Cycles : 5 cycles Pre-treatment : Perform a heat treatment at 150+0/-10C for 1hour and then let sit for 24+/-2hours at room temperature, then measure. Post-treatment : Let sit for 24+/-2hours at room temperature, then measure. Voltage Proof Pre-treatment : Perform a heat treatment at 150+0/-10C for 1hour and then let sit for 24+/-2hours at room temperature, then measure. Post-treatment : Let sit for 24+/-2hours at room temperature, then measure.
High Temperature High Humidity (Steady)	Appearance: No defects or abnormalities. Capacitance: Within +/-12.5% Change Q or D.F.: DF:0.2 max. I.R.: More than 500M or 12.5F (Whichever is smaller)	Solder the capacitor on the test substrate shown in Fig.3. Test Temperature : 40+/-2 Test Humidity : 90%RH to 95%RH (Steady) Test Time : 500+/-12h Test Voltage : Rated Voltage Charge/Discharge Current : 50mA max. Pre-treatment : Perform a heat treatment at 150+0/-10C for 1hour and then let sit for 24+/-2hours at room temperature, then measure. Post-treatment : Perform a heat treatment at 150+0/-10C for 1hour and then let sit for 24+/-2hours at room temperature, then measure.
Durability	Appearance: No defects or abnormalities. Capacitance: Within +/-12.5% Change Q or D.F.: DF:0.2 max. I.R.: More than 1000M or 25F (Whichever is smaller)	Solder the capacitor on the test substrate shown in Fig.3. Test Temperature : Maximum Operating Temperature+/-3 Test Time : 1000+/-12h Test Voltage : 100% of the rated voltage Charge/Discharge Current : 50mA max. Pre-treatment : Perform a heat treatment at 150+0/-10C for 1hour and then let sit for 24+/-2hours at room temperature, then measure. Post-treatment : Perform a heat treatment at 150+0/-10C for 1hour and then let sit for 24+/-2hours at room temperature, then measure.