General Purpose Chip Multilayer Ceramic Capacitors 10pF 50V C0G muRata GRM1555C1H100JA01D Chip Type

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Price: Negotiable

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Delivery Time: Negotiable

Product Description

Product Overview

This product specification applies to Chip Multilayer Ceramic Capacitors used for General Electronic equipment. These capacitors are designed for general-purpose applications.

Product Attributes

Brand: MURATA

Technical Specifications

Part Number	Size Code	Temperature Characteristics	Rated Voltage	Nominal Capacitance	Capacitance Tolerance	Packaging Code	Dimensions (L x W x T)	Packaging Unit
GRM1555C1H100JA01	0402	C0G(EIA)	DC 50 V	10pF	+/-5%	D (10000 pcs./Reel, 180mm Reel, PAPER Tape)	0.4 x 0.2 x 0.2 mm (approx.)	10000 pcs./Reel
GRM1555C1H100JA01	0402	C0G(EIA)	DC 50 V	10pF	+/-5%	J (50000 pcs./Reel, 330mm Reel, PAPER Tape)	0.4 x 0.2 x 0.2 mm (approx.)	50000 pcs./Reel
GRM1555C1H100JA01	0402	C0G(EIA)	DC 50 V	10pF	+/-5%	W (20000 pcs./Reel, 180mm Reel, PAPER Tape)	0.4 x 0.2 x 0.2 mm (approx.)	20000 pcs./Reel

Specifications and Test Methods

Item	Specification	Test Method (Ref. Standard:JIS C 5101, IEC60384)
Rated Voltage	Shown in Rated value. The rated voltage is defined as the maximum voltage which may be applied continuously to the capacitor. When AC voltage is superimposed on DC voltage, VP-P or VO-P, whichever is larger, should be maintained within the rated voltage range.
Appearance	No defects or abnormalities.	Visual inspection.
Dimension	Shown in Rated value.	Using Measuring instrument of dimension.
Voltage Proof	No defects or abnormalities.	Measurement Point : Between the terminations Test Voltage : 300% of the rated voltage Applied Time : 1s to 5s Charge/Discharge Current : 50mA max.
Insulation Resistance(I.R.)	More than 10000M	Measurement Temperature:Room Temperature Measurement Point : Between the terminations Measurement Voltage : Rated Voltage Charging Time : 2min Charge/Discharge Current : 50mA max.
Capacitance	Shown in Rated value.	Measurement Temperature:Room Temperature Measurement Frequency : 1.0+/-0.1MHz Measurement Voltage : 0.5 to 5.0Vrms
Q or Dissipation Factor (D.F.)	Q400+20C C:Nominal Capacitance(pF)	Measurement Temperature : Room Temperature Measurement Frequency : 1.0+/-0.1MHz Measurement Voltage : 0.5 to 5.0Vrms
Capacitance (Temperature Characteristics)	Nominal value of the temperature coefficient is shown in Rated value. The capacitance change should be measured after 5 minutes at each specified temperature stage. Capacitance Drift:Within +/-0.2% or +/-0.05pF (Whichever is larger)	Measurement Voltage : Less than 1.0Vrms (Refer to the individual data sheet)
Adhesive Strength of Termination	No removal of the terminations or other defect should occur.	Solder the capacitor on the test substrate shown in Fig.3. Termination Applied Force : 5N Holding Time : 10+/-1 Applied Direction : In parallel with the test substrate and vertical with the capacitor side
Vibration	Appearance: No defects or abnormalities. Capacitance: Within the specified initial value. Q or D.F.: Within the specified initial value.	Solder the capacitor on the test substrate shown in Fig.3. Kind of Vibration : A simple harmonic motion 10Hz to 55Hz to 10Hz Vibration Time : 1min Total Amplitude : 1.5mm This motion should be applied for a period of 2hours in each 3 mutually perpendicular directions(total of 6hours).
Substrate Bending Test	Appearance: No defects or abnormalities. Capacitance: Within +/-5% or +/-0.5pF (Whichever is larger)	Solder the capacitor on the test substrate shown in Fig.1. Pressurization Method : Shown in Fig.2. Flexure : 1mm Holding Time : 5+/-1s Soldering Method : Reflow soldering
Solderability	95% of the terminations is to be soldered evenly and continuously.	Test Method : Solder bath method Flux : Solution of rosin ethanol 25(mass)% Preheat : 80 to 12010s to 30s Solder : Sn-3.0Ag-0.5Cu(Lead Free Solder) Test Temp. : 245+/-5 Test Time : 2+/-0.5s
Resistance to Soldering Heat	Appearance: No defects or abnormalities. Capacitance: Within +/-2.5% or +/-0.25pF (Whichever is larger) Q or D.F.: Within the specified initial value. I.R.: Within the specified initial value. Voltage Proof: No defects.	Test Method : Solder bath method Solder : Sn-3.0Ag-0.5Cu(Lead Free Solder) Solder Temp. : 270+/-5 Preheat Temp. : 120 to 150 Preheat Time : 1min Post-treatment : Let sit for 24+/-2hours at room temperature, then measure.
Temperature Sudden Change	Appearance: No defects or abnormalities. Capacitance: Within +/-2.5% or +/-0.25pF (Whichever is larger) Q or D.F.: Within the specified initial value. I.R.: Within the specified initial value. Voltage Proof: No defects.	Solder the capacitor on the test substrate shown in Fig.3. Cycles : 5 cycles Post-treatment : Let sit for 24+/-2hours at room temperature, then measure.
High Temperature High Humidity (Steady)	Appearance: No defects or abnormalities. Capacitance: Within +/-7.5% or +/-0.75pF (Whichever is larger) Q or D.F.: Q100+10C/3 C:Nominal Capacitance(pF) I.R.: More than 500M or 25F (Whichever is smaller)	Solder the capacitor on the test substrate shown in Fig.3. Test Temperature : 40+/-2 Test Humidity : 90%RH to 95%RH (Steady) Test Time : 500+/-12h Test Voltage : Rated Voltage Charge/Discharge Current : 50mA max. Post-treatment : Let sit for 24+/-2hours at room temperature, then measure.
Durability	Appearance: No defects or abnormalities. Capacitance: Within +/-3% or +/-0.3pF (Whichever is larger) Q or D.F.: Q275+5C/2 C:Nominal Capacitance(pF) I.R.: More than 1000M or 50F (Whichever is smaller)	Solder the capacitor on the test substrate shown in Fig.3. Test Temperature : Maximum Operating Temperature+/-3 Test Time : 1000+/-12h Test Voltage : 200% of the rated voltage Charge/Discharge Current : 50mA max. Post-treatment : Let sit for 24+/-2hours at room temperature, then measure.