Metal Alloy Current Sensing Chip Resistors Featuring PAKER RA2512F3R50MGD High Stability and Reliability

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Product Description

Product Overview

The RAxxx Series Metal Alloy Current Sensing Chip Resistors are designed for high stability and reliability, featuring ultra-low resistance values and excellent temperature coefficient characteristics. These resistors offer high power ratings up to 3 watts and are halogen-free and RoHS compliant. They are suitable for demanding applications in automotive electronics, current sensing, mobile phones, computers, power supplies, and battery chargers, adhering to AEC-Q200 provisions.

Product Attributes

Brand: (Pakermicro)
Origin: Shenzhen, China
Material: Metal Alloy
Package: Plastic Package Epoxy UL: 94V-0
Certifications: Halogen free, RoHS compliant, AEC-Q200 relevant provisions
Mounting Position: Any
Electrode Size: Large electrode ()

Technical Specifications

Specification	Details
Series	RAxxx Series
Type	Metal Alloy Current Sensing Chip Resistors
Models	RA1206, RA2512, RA0805
Rated Power	RA1206: 1W, 1/2W RA2512: 2W, 3W RA0805: 1/4W, 1/2W
Resistance Range (D, F, G, H, J tolerance)	RA1206: 1m~100m (1W), 110m~200m (1/2W) RA2512: 0.5m~500m (3W), 0.5m~4m (Large electrode), 1m~500m (2W) RA0805: 1m (1/2W), 2m~20m (1/4W)
TCR (ppm/)	1m: 350 2m~100m: 50 110m~200m: 50 (RA1206) 0.5 m, 1m: 350 2m~500m: 50 (RA2512) 1m: 350 2m~20m: 50 (RA0805)
Insulation Resistance	>100M
Operating Temperature Range	-55 to +170
Dimensions (L x W x T, E)	RA1206: 3.2x1.6x0.60 mm (E: 0.50 mm) RA2512: 6.4x3.2x0.80 mm (Large electrode: 2.20 mm, Small electrode: 0.90 mm) RA0805: 2.0x1.25x0.60 mm (E: 0.40 mm)
Packing Code	G (reel), V (bulk)
Marking (4-digit for 0.5% to 5% tolerance)	First letter 'R' denotes 10^-3, followed by three digits for resistance value.
Rated Current Calculation	I = √(P / R)
ESD Test	2KV, 2 times/1s (AEC-Q200-002)
Reliability Test Items	Solderability, Resistance to soldering heat, Mechanical Shock, Resistance to 100g's, Terminal Bending, Terminal Strength, Biased Humidity, Operational life, Temperature cycling, Short-time overload, High Temperature Exposure, Low Temperature operation, Thermal shock. (Refer to specific test methods and conditions in the datasheet)