Common Mode Choke SRCM 3225 102TT00 SOREDE with Ni Zn Ferrite Core Copper Wire and Sn 0 7Cu Solder

Price Negotiable

Price: Negotiable

MOQ: Negotiable

Delivery Time: Negotiable

Product Description

Product Overview

This document is an acknowledgment for the SRCM.3225.102TT00 Common Mode Choke, manufactured by Shenzhen Sorvida Electronics Co., Ltd. It details the product's specifications, dimensions, materials, testing conditions, electrical characteristics, packaging, and reliability tests. This acknowledgment is for customer review and signature before order placement.

Product Attributes

Brand: Sorvida ()
Origin: Shenzhen, China
Materials: Ni-Zn Ferrite Core, Sn-0.7Cu Solder, Copper Wire (P180-G1)

Technical Specifications

Part Number	Impedance () 25%	Test Freq. (MHz)	DCR Max. ()	Rated Voltage Vdc (max.)	Rated Current (mA)(max.)	Withstand Volt. (Vdc) max.	IR () min.	Dimensions (mm)	Core Material	Solder Material	Wire Material
SRCM.3225.102TT00	1000	100	0.30	50	400	125	10M	3.20.2 (A), 2.50.2 (B), 2.20.2 (C)	Ni-Zn Ferrite	Sn-0.7Cu	Copper Wire P180-G1

Reliability Tests

NO.	Item	Specifications	Test Methods
1	Solder- Ability	More than 90% of termination should be covered with new solder.	Solder: Sn, Temperature: 255+5/-0, Flux: rosin, Duration: 3.50.5s
2	Leaching Resistance	More than 75% of termination Should be covered with new solder.	Solder: Sn, Temperature:270+2/-0, Flux: rosin, Duration: 100.5s
3	Drop	No mechanical damage shall be noticed Impedance shall be within 20% of the initial value	Drop 10 times on a concrete floor from a height of 1m.
4	Vibration	-	Frequency: 10 to 55Hz, Amplitude: 1.52mm, Direction and time: X, Y and Z directions for 2 hours each.
5	Humidity resistance	a. Test condition: Temp.: 405, Humidity: 90%~95%, Test time: 50012hr. b. Measurement method: The component should be stabilized at normal condition for 24 hours before test.	-
6	High temperature resistance	a. Test condition: Applied rated current, Temp.: 855, Test time: 50012hr. b. Measurement method: The component should be stabilized at normal condition for 24 hours before test.	-
7	Low temperature resistance	No mechanical damage shall be noticed Impedance shall be within 20% of the initial value	a. Test condition: Temp.: -405, Test time: 50012hr. b. Measurement method: The component should be stabilized at normal condition for 24 hours before test.
8	Thermal shock	a. Test condition: 1) Temp.: -40, time: 303min 2) Temp.: +85, time: 303min, 100 cycles b. Measurement method: The component should be stabilized at normal condition for 24 hours before test.	-