ISO 7765 ASTM D1709 Thin Film Falling Dart Impact Tester
Price:
Negotiable
MOQ:
1 set
Delivery Time:
3-7 Days
Brand:
ZL
Product Description
ISO 7765 ASTM D1709 Thin Film Falling Dart Impact Tester
This precision testing instrument evaluates the impact resistance performance of thin film materials using free-falling dart cascade methods, compliant with international standards including GB/T 9639.1-2008 Method A and ISO 7765-88 requirements.
Product Overview
The Thin Film Falling Dart Impact Tester is engineered to determine the impact resistance of plastic films and thin wafers through controlled free-fall impact testing.
Application Scope
This instrument is suitable for testing plastic films and wafers with thickness less than 1 mm, capable of measuring breakthrough quality for materials weighing 0.05 to 2 kg.
Testing Principle
Using either Method A or Method B, the instrument determines the falling mass quantity that causes 50% sample damage under specified test conditions.
Technical Specifications
| Parameter | Specification |
|---|---|
| Control Mode | Touch screen |
| Output Mode | Thermal printer |
| Testing Methods | Method A & Method B |
| Test Range | Method A: 50-2000 g, Method B: 120-2000 g |
| Falling Dart Head Diameter | Method A: 38 mm, Method B: 50 mm |
| Test Height | 0.3-1.5 m (manually adjustable) |
| Standard Test Conditions | 23°C, 50% RH |
| Sample Clamping | 125 mm |
| Power Requirements | 30W |
| Air Pressure Requirements | > 0.5 MPa |
| Machine Dimensions | Method A: 450*530*1500 mm, Method B: 450*530*2050 mm |
| Net Weight | Approximately 45 kg (both methods) |
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Company
Dongguan Zhongli Instrument Technology Co., Ltd.
Location
No.62, Xinhe Management of Area, Wanjiang District, Dongguan city, Guangdong province ,China
Contact Person
Fiona Zhong