Pego Electronics (Yi Chun) Company Limited
                                                                                                           
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10 N Force Jointed Test Finger , IEC60529 Test Probe B Easy Operation

Price Negotiable
Price: USD450-600/set
MOQ: 1set
Delivery Time: 15 working days
Brand: PEGO
Product Description

IEC61032 Test Finger Probe Test Probe B Jointed Test Finger 10N Force

 

1. Introduction of Test Probe B:

The test probe is is design according to IEC61032 figure 2, meet the requirements of UL507, UL1278 figure 8 and EN60529 figure 2. The jointed test finger is intended to verify the basic protection against access to hazardous parts. It is used to verify the protection against access with finger.

 

2. Specification Jointed Test Finger:

Diameter of dactylogryposis: 12mm Length of dactylogryposis: 80mm
Diameter of baffle: 50mm Length of baffle: 100mm  
Material: Insulating material (baffle and handle), metal(dactylogryposis)

 

3. Key Advantage of Jointed Finger Probe

1) Can pass the calibration from third lab authorized by ISO17025

2) It's fully meets the requirements of IEC61032 and IEC60529 standard

3) Easy operation

 

4. Picture of IEC61032 Test Finger Probe:

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Have questions about our products or want to discuss a custom order? Our team is ready to help you.

Company Pego Electronics (Yi Chun) Company Limited
Location No. 317, Yichun South Road ( Happiness Park), Yuanzhou District, Yichun, Jiangxi, 336000, China
Contact Person Penny Peng

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