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China IEC60529 Standard Test Probe B , IP2X Jointed Test Finger 100 Millimeter for sale

IEC60529 Standard Test Probe B , IP2X Jointed Test Finger 100 Millimeter

Price Negotiable
Price: USD300~USD400
MOQ: 1 set
Delivery Time: 7 working days
Brand: PEGO
Product Description

IP Testing Equipment Test Probe B for IP2X Testing Jointed Test finger

 

Introduction:

Design according to IEC61032 figure 2, meet the requirements of UL507, UL1278 figure 8 and EN60529 figure 2. This probe is intended to verify the basic protection against access to hazardous parts. It is used to verify the protection against access with finger.

 

Specification:

Diameter of dactylogryposis: 12mm Length of dactylogryposis: 80mm
Diameter of baffle: 50mm Length of baffle: 100mm
Material: Insulating material (baffle and handle), metal(dactylogryposis)

 

Picture:

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Have questions about our products or want to discuss a custom order? Our team is ready to help you.

Company Pego Electronics (Yi Chun) Company Limited
Location No. 317, Yichun South Road ( Happiness Park), Yuanzhou District, Yichun, Jiangxi, 336000, China
Contact Person Penny Peng

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