Surface Morphology Measuring Instrument Nanometer Micrometer Topography Measurement Device
Surface Morphology Measuring Instrument Nanometer Micrometer Topography Measurement Device
Description
The surface topography measurement instrument is a measurement device specifically designed for the microscopic morphology analysis of high-precision parts, featuring high-precision measurement capabilities and excellent stability.
In the field of precision manufacturing, the traditional measurement method of just one dimension is no longer sufficient to meet the stringent quality requirements of modern industries for parts. Although conventional size detection can reflect the geometric tolerances of parts, it is difficult to capture the key influence of the surface micro-topography on the performance of the parts.
The topography measurement instrument breaks through the limitations of traditional measurement methods and is specifically designed for the microscopic morphology analysis of high-precision parts. It adopts advanced contact sensor technology to accurately measure surface features ranging from nanometers to micrometers.
Technical Parameters
|
Measuring Range |
X-axis |
120-220 mm |
|
|
X-axis Resolution |
1.2 nm |
|
|
Z-axis |
420 mm, 620 mm (optional) |
|
Profile Sensor |
Z1-axis Measuring Range |
30-60 mm |
|
|
Z1 Resolution |
1.2 nm |
|
Profile Accuracy |
Z1 Linear Accuracy |
≤±(0.5 +|0.02H|) μm |
|
|
Circular Arc |
±(1 + R/12) μm |
|
|
Circular Arc Pt |
≤0.3 μm |
|
|
Angle |
±1′ |
|
|
Straightness |
0.3 μm/100 mm (cut-off wavelength 0.8) |
|
Driving Speed |
X-axis Driving Mode |
Electric |
|
|
Y-axis Driving Mode |
Electric |
|
Maximum Measuring Speed |
|
2 mm/s |
|
Marble Dimensions |
|
500 mm × 800 mm |
|
Countertop Material |
|
Natural marble |
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