IEC60884-1 Figure 27 and Figure 42 Low Temperature Impact Test Apparatus for Testing Pin-Insulating Seelves, Plug

IEC60884-1 Figure 27 and Figure 42 Low Temperature Impact Test Apparatus for Testing Pin-Insulating Seelves, Plug and Socket-Outlets

1. Introduction:

Low temperature impact test apparatus is designed according to IEC60884-1 clause24.4/figure 27 and clause 30.4/figure 42, IEC60811-1-4 clause 8.5, VDE0620, GB2951.4, GB2099.1 clause 24.4 and 30.4 figure 27 & figure 42 and etc.. The apparatus for impact test at a low temperature should work with low temperature chamber and it should be placed on a 40mm thick sponge rubber pad.

This apparatus is to perform an impact test from a height of of 100mm with a falling weight of 100g or 1000g to pin-insulating sleeves, plug and socket-outlets at a low temperature to meet the test requirements of IEC60884-1 clauses 24.4 and 30.4, after the test, no cracks of the insulating sleeves shall be visible with normal or corrected vision without addition magnification, and no damages shall be shown on the sample.

The apparatus is also can perform an impact test from 100mm to power cables, flexible cables and cords with PVC insulation and sheaths at a low temperature, the mass of the falling weight is determined by the overall diameter of the cable (see below table 1 and table 2), the test can meet the test requirements of IEC60811-1-4 clause 8.5 and figure 1. After the test, no cracks of the insulating sheaths shall be visible with normal or corrected vision without addition magnification.

2. Specification: