Standard Test Finger Probe with 30±0.2 Jointed Point 80±0.2 Length and 180±0.2 Fingertip to Baffle for Accessibility Testing
Price:
Negotiation
MOQ:
1 set
Delivery Time:
3 working days
Brand:
Pego Electronics
Product Description
Insulating Material Standard Test Finger for Accessibility Test Thruster 0N-50N
Standard Test Finger for Accessibility Test
Introduction
The Standard Test Finger, also known as jointed test finger or test probe B, simulates human fingers to verify accessibility to hazardous parts in electrical and electronic devices. This essential testing tool is widely referenced in standards including IEC60335-1, IEC62368-1, and IEC60598-1.
Designed in strict compliance with IEC61032 Figure 2, the probe features an insulating handle and metal finger. The built-in 0-50N thruster accommodates required test forces of 10N and 30N. An integrated wire connects to an electrical indicator to detect accessibility of hazardous live parts.
Specification
| Model | PG-TPB |
|---|---|
| Jointed point size 1 | 30±0.2 |
| Jointed point size 2 | 60±0.2 |
| Length of finger | 80±0.2 |
| Fingertip to baffle size | 180±0.2 |
| Fingertip taper fillet | S4±0.05 |
| Diameter of finger | Ф12 0 -0.05 |
| Diameter of baffle | Ф75±0.2 |
| Thickness of baffle | 5±0.5 |
| A-A section diameter | Ф50 |
| A-A section width | Ф20±0.2 |
| Thruster | 10N optional |
| Standard | IEC61032 |
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Company
Pego Electronics (Yi Chun) Company Limited
Location
No. 317, Yichun South Road ( Happiness Park), Yuanzhou District, Yichun, Jiangxi, 336000, China
Contact Person
Penny Peng