Test Probe B Jointed Test Finger Ip Ingress Protection IEC60335-1 / IEC60529 / IEC61032
IEC60335-1 / IEC60529 / IEC61032 IP Code Probes Test Probe B Jointed Test Finger
1. Introduction of Test Probe B:
Test probe B ( jointed test finger) is intended to verify the basic protection against access to hazardous parts. The jointed test finger is also used to verfiy the protection against access with a finger. It is design according to IEC61032 figure 2, meet the requirements of UL507, UL1278 figure 8 and EN60529 figure 2.
Test probe B with 10N force is for IP2X testing, it means for the protection of person’s finger from hazard parts.
2. Specification of Jointed Test Finger
| Model | PG-TPB | PG-TPB(1) | PG-TPB(2) | PG-TPB(3) |
| Jointed size 1 | 30±0.2 | 30±0.2 | 30±0.2 | 30±0.2 |
| Jointed size 2 | 60±0.2 | 60±0.2 | 60±0.2 | 60±0.2 |
| Finger length | 80±0.2 | 80±0.2 | 100±0.2 | 80±0.2 |
| Fingertip to baffle size | 180±0.2 | 180±0.2 | ---- | 180±0.2 |
| Fingertip cutting cylindrical | R2±0.05 | R2±0.05 | R2±0.05 | R2±0.05 |
| Fingertip fillet | S4±0.05 | S4±0.05 | S4±0.05 | S4±0.05 |
| Fingertip cut angle | 37o 0 -10′ | 37o 0 -10′ | 37o 0 -10′ | 37o 0 -10′ |
| Fingertip taper | 14 o 0 -10′ | 14 o 0 -10′ | 14 o 0 -10′ | 14 o 0 -10′ |
| Diameter | Ф12 0 -0.05 | Ф12 0 -0.05 | Ф12 0 -0.05 | Ф12 0 -0.05 |
| Diameter of section A-A | Ф50 | Ф50 | ---- | Ф50 |
| Width of sectrion A-A | 20±0.2 | ---- | ---- | 20±0.2 |
| Diameter of baffle | Ф75±0.2 | Ф75±0.2 | Ф125±0.2 | Ф75±0.2 |
| Thickness of baffle | 5±0.5 | 5±0.5 | ---- | 5±0.5 |
| Force | ---- | ---- | ---- | 10-30N |
| Standard comply to | IEC61032 | IEC60335-1 | IEC60335-2-14 | IEC60529 |
3. Figure of Test Finger Probe
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