Settled Fe Probe Coating Thickness Gauge Film Thickness Tester
Price:
Based on quantity
MOQ:
1 Set
Delivery Time:
In 7-10 work days
Brand:
LEEB
Product Description
Settled Fe Probe Coating Thickness Gauge Film Thickness Tester
Settled Fe Probe And Plastic Shell Coating Thickness Gauge With Switch off automatically or manually
Functions & Features
● High quality metal probes.
● Two measuring methods:continuous and single;
● Two working mode: direct and batch;
● Limit setting function.
● Switch off automatically or manually.
Measuring Materials
Magnetic Induction (Fe): Measuring the thickness of Non-magnetic coating on magnetic metal substrate,
such as aluminum, chromium, copper, zinc, rubber, paint on the base of steel, iron, alloy and magnetic
steel
Technical Parameters
| Technical Parameters | ||||||||
| Model No. | Leeb250A | |||||||
| Measuring principle | Fe | |||||||
| Measuring range (µm) | 0~1250μm | |||||||
| Probe | Settled | |||||||
| Shell | Plastic | |||||||
| Accuracy | ±(1~3%H+1) μm; H refers to the thickness of testing piece | |||||||
| Minimum resolution (µm) | 0.1μm | |||||||
| Min curvature of the min area (mm) | Convex1.5 Concave9 | |||||||
| Diameter of the min area (mm) | Φ7 | |||||||
| Critical thickness of substrate (mm) | 0.5 | |||||||
| Memory | 200 groups measured data | |||||||
| Dimensions | 115*55*23mm | |||||||
| Power supply | AAA Alkaline battery | |||||||
| Standard Configuration |
Main unit,5 calibration specimens (48.5μm,99.8μm,249μm,513μm 1024μm),1 probe & substrate
|
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| Optional Accessories |
Probes,Specimens,1 leather sheath
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Troubleshooting
The following error information table to tell you how to identify and troubleshoot:
|
Error code
|
Implications of error code
|
The cause and solution
|
|
E02
|
Probe or instrument damage | Repair probe or instrument |
|
E03
|
Probe or instrument damage
|
Repair probe or instrument
|
|
E04
|
Measured values occur large fluctuations
(For example when soft layer measurements);
Magnetic field effect
|
When the measure menton
the softcover, auxiliary device to
measure should be adopted;Stay away from the
strong magnetic field environment
|
|
E05
|
Too close to the probe from the metal substrate when the phone is switched on
|
Probe from the metal substrate
|
|
E08
|
Probe or instrument damage
|
Repair probe or instrument
|
|
E11
|
Probe model in conformity with this group of the original data corresponding to the probe model
|
Replace the suitable probe
Choose an unused group units
Delete after calibration again
|
|
E15
|
Zero deviation is too big, can not be zero
|
Select the appropriate substrate or repair equipment
|
|
E20
|
This set of unit for calibration value
|
Choose an unused group unit Or delete after calibration again
|
High quality Equipment Box:
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Get in Touch
Have questions about our products or want to discuss a custom order? Our team is ready to help you.
Company
Chongqing Leeb Instrument Co.,Ltd
Location
High&New Technology Industrial Park, Yubei District, Chongqing, China
Contact Person
Leeb Team