1250μM Film Coating Thickness Gauge Large Memory Five Statistics

Name: 1250u03bcM Film Coating Thickness Gauge Large Memory Five Statistics
Brand: Chongqing Leeb Instrument Co.,Ltd

Price Negotiable

Price: Based on quantity

MOQ: 1 Set

Delivery Time: In 7-10 work days

Brand: LEEB

Product Description

1250μM Film Coating Thickness Gauge Large Memory Five Statistics

Large Memory Five Statistics Metal Shell Coating Thickness Gauge With Fe And NFe Function

Functions & Features

● With high quality metal probes and shell.
● Large memory to save 4 types of materials and 1560 testing values.
● Software for PC connection and data transmission, analysis.
● Two measuring methods:continuous and single;
● Two working mode: direct and batch;
● Limit setting function.
● Switch off automatically or manually.
● 3 ways for easy Calibration: by one specimen, two specimens or five specimens to calibrate..
● Five statistics: Average, Maximum, Minimum, Testing times, Standard deviation.
● 3 years warranty and life-long services

Technical Parameters

Technical Parameters
Model No.		Uee922
Measuring principle		Magnetic induction (Fe ) & Eddy current ( NFe)
Measuring range (µm)		0~1250μm
Probe		Changeable
Shell		Metal
Accuracy		±(2%H+1) μm; H refers to the thickness of testing piece
Minimum resolution (µm)		0.1μm
Min curvature of the min area (mm)		Convex1.5 Concave9
Diameter of the min area (mm)		Φ7
Critical thickness of substrate (mm)		0.5
Memory		1560
Dimensions		1307030mm
Power supply		2*AA Alkaline battery
Standard Configuration		Main Machine, probe1(Fe or NFe), substrate1(Fe or NFe), software & USB, Calibration specimens*5, Users’ Manual, Qualified Certificate, Coin screwdriver, Packing list, Warranty card
Optional Accessories		Probes,Specimens

Substrate

a) Standard methods for magnetic substrate metal magnetic properties and surface roughness, tested should stay with the substrate metal magnetic and surface roughness is similar.For eddy current method, standard pieces of the electrical properties of the metal matrix, and the tested should stay with the substrate similar to the electrical properties of the metal.To confirm the applicability of the standard piece, available

standard piece of base metal and under test on a substrate metal comparing measured by the readings.

b) If under test pieces of metal substrate thickness is no more than the critical thickness stipulated in the table 1, the following two methods can be used for calibration:

1) Stay with the same test pieces of metal substrate thickness metal on-chip calibration standard;

2) With a sufficient thickness, electrical properties of similar metal liner metal standard or specimen, but it must be made between base metal

and liner metal without clearance. On the two sides have cladding specimens, cannot use liner method.

c) If the curvature of the coating under test has reached the calibration can't on the plane, have the covering layer of the curvature of the standard piece or of the curvature of the substrate metal under calibration foils, shall be the same with the curvature of

PC Software:

Software for PC connection and data transmission, analysis.

Packing box: High quality water-proof box

Get in Touch

Have questions about our products or want to discuss a custom order? Our team is ready to help you.

Company Chongqing Leeb Instrument Co.,Ltd

Location High&New Technology Industrial Park, Yubei District, Chongqing, China

Contact Person Leeb Team

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