Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X
Price:
Customized
MOQ:
1
Delivery Time:
3 Days
Brand:
Sinuo
Product Description
Standard Test Probe B With 50N Force For IEC61032 Figure 2 And IEC 60529 IP2X
Product information:
This test probe complies with the requirements of Probe B as specified in IEC 61032 and IEC 60529 IP2X. It features an M6 threaded hole at the end of the handle, allowing it to be connected to a force gauge for precise testing applications.
Technical parameters:
| Parameters /Model | SN2210-2T |
| Name | Standard test probe with force |
| Joint 1 | 30±0.2 (mm) |
| Joint 2 | 60±0.2 (mm) |
| Finger length | 80±0.2 (mm) |
| Fingertip to baffle | 180±0.2 (mm) |
| Cylindrical | R2±0.05 (mm) |
| Spherical | S4±0.05 (mm) |
| Fingertip cutting bevel angle | 37o 0 -10’ |
| Fingertip taper | 14 o 0 -10’ |
| Test finger diameter | Ф12 0 -0.05 (mm) |
| A-A Section diameter | Ф50(mm) |
| A-A Section width | 20±0.2 |
| Baffle diameter | Ф75±0.2(mm) |
| Baffle thickness | 5±0.5(mm) |
| Built-in Force | 0-50N force, resolution of 5N |
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Company
Sinuo Testing Equipment Co. , Limited
Location
Room 101, 1st Floor, No. 6, Third Street, Pingshan Industrial Zone 511495, Shibi Street, Panyu District, Guangzhou, China
Contact Person
Zoe Zou