Optical Testing Equipment
Operating Wavelength 633 Nm Optical Testing Equipment Flatness Tester
High Precision Flatness Tester Applications For flatness high-precision testing of metal components, marble and other sealing components. Working Principle Flatness testing technology based on multi-aperture integral detection. Features Model FI200 Maximum detection caliber ≥Φ200mm (Customizable) Masking ≤Φ40mm, window mirror fixation Operating wavelength 633nm Operating field of view ≥±2' Minimum band size detected 4mm Detection precision(PV) ≤0.2um, band 4mm (The wider the
VIS 520nm 590nm 650nm Birefringence Measurement System Equipment
Stress Magnitude Birefringence Measurement System Optical Testing Equipment Real Time Applications UV-ultraviolet Semiconductor Light source raw material manufacturer VIS-visible Lens, optical raw material, film Automotive industry: windshield, vehicle-mounted glass Transparent resin PET PMMA Glass substrate, quartz glass, sapphire Stress sample testing before and after coating Food and drug and high-end glass jigs, minerals Light guide plate, display component NIR-near
Semiconductor Surface Detector Systems Optical Testing Equipment 40x
Semiconductor Surface Detector Systems Optical Testing Equipment 40x Applications For the process control and yield management of blank mask in the fields of semiconductor display and integrated circuit chip manufacturing, we use high throughput optical testing technologies to make fast and accurate automatic detection for the surface defects of blank mask. According to professional user needs, we have developed series of high throughput MASK inspection machines with reliable
Real Time Stress Magnitude Stress Distribution Birefringence Measurement Detection Equipment
Real-time Stress Birefringence Detection Equipment Applications UV-ultraviolet Semiconductor Light source raw material manufacturer VIS-visible Lens, optical raw material, film Automotive industry: windshield, vehicle-mounted glass Transparent resin PET PMMA Glass substrate, quartz glass, sapphire Stress sample testing before and after coating Food and drug and high-end glass jigs, minerals Light guide plate, display component NIR-near-infrared Infrared equipment processing
Stress Magnitude Birefringence Measurement System Optical Testing Equipment Real Time
Real-time Stress Birefringence Detection Equipment Applications UV-ultraviolet Semiconductor Light source raw material manufacturer VIS-visible Lens, optical raw material, film Automotive industry: windshield, vehicle-mounted glass Transparent resin PET PMMA Glass substrate, quartz glass, sapphire Stress sample testing before and after coating Food and drug and high-end glass jigs, minerals Light guide plate, display component NIR-near-infrared Infrared equipment processing
ZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect Detection
Structural Light Large Size Surface Shape Detection Equipment Applications Lamp reflector shape detection; wafer flatness detection; car paint surface detection; lens surface shape detection. Working Principle The display projects the structured light in stripe form, and the camera collects the structured light from the measured surface, the collected stripe is deformed through the modulation of the measured surface, the point cloud distribution and curvature distribution of
Scratches Dusts Optical Testing Equipment Semiconductor Surface Detector 1.8μM
Semiconductor Material Surface Defect Detector Applications For the process control and yield management of blank mask in the fields of semiconductor display and integrated circuit chip manufacturing, we use high throughput optical testing technologies to make fast and accurate automatic detection for the surface defects of blank mask. According to professional user needs, we have developed series of high throughput MASK inspection machines with reliable quality and high cost
Scratches Dusts Semiconductor Surface Detection Equipment Resolution 1.8μM
Scratches Dusts Optical Testing Equipment Semiconductor Surface Detector 1.8μM ApplicationsFor the process control and yield management of blank mask in the fields of semiconductor display and integrated circuit chip manufacturing, we use high throughput optical testing technologies to make fast and accurate automatic detection for the surface defects of blank mask. According to professional user needs, we have developed series of high throughput MASK inspection machines with