Optical Testing Equipment
633nm Optical Flatness Tester FI200 High Precision 0.2um for Metal Components
High precision flatness tester operating at 633nm with detection precision ≤0.2um. Features customizable caliber up to Φ200mm and multi-aperture integral detection. Ideal for metal, marble, and sealing components. ISO certified with 24-hour response.
VIS 520nm 590nm 650nm Birefringence Measurement System 1-280nm Range
Real-time birefringence measurement system for stress magnitude and distribution analysis. Supports VIS bands 520nm, 590nm, 650nm with 1-280nm range and 0.05mm spatial resolution. Ideal for optics, semiconductors, and automotive glass. Custom options available.
Semiconductor Surface Detector System Optical Testing Equipment 40x 1μm
High throughput optical testing for blank mask surface defects in semiconductor and display manufacturing. Detects scratches and dust down to 1μm with 40x magnification. Customizable models available. ISO certified.
Real Time Stress Birefringence Measurement Equipment BM1-110 BM1-280 520nm 650nm
Real-time measurement of stress magnitude and distribution with 0.05mm spatial resolution and 0.1nm repeatability. Supports VIS bands 520nm, 590nm, 650nm. Customizable for UV to NIR applications in semiconductors, optics, and automotive. ISO certified, manufacturer direct.
Real Time Stress Birefringence Measurement System BM1-110 BM1-280 Optical Testing Equipment
Real-time birefringence detection for UV to NIR bands. Measures stress magnitude and distribution with 0.1nm repeatability and 0.05mm spatial resolution. Customizable models BM1-110 and BM1-280. ISO certified, ideal for semiconductors, optics, and automotive glass.
ZEIT SI200-150 Structured Light Surface Shape Detection Equipment 200x150mm
High-precision optical testing equipment for lamp reflector, wafer flatness, and surface defect detection. Features ±3μm absolute error, adjustable 0.25mm resolution, and ISO certification. Custom production available from manufacturer with 24-hour response.
Semiconductor Surface Defect Detector 1.8μm Resolution Optical Testing Equipment for Scratches Dusts
High throughput optical detector for blank mask surface defects in semiconductor display and IC manufacturing. Detects scratches and dusts down to 1μm with 1.8μm resolution. Features 40x magnification, 0.5mm x 0.5mm field of view, and customizable production. ISO certified.
Semiconductor Surface Defect Detection Equipment 1.8μm Resolution 40x Magnification
High throughput optical tester for blank mask surface defects. Detects scratches and dusts down to 1μm with 1.8μm resolution and 40x magnification. Customizable production available. ISO certified manufacturer with 60+ patents.