Surface Defect Detection Equipment
IC Chip Surface Defect Detection Equipment 1μm Scratches Dusts Inspection
Automated surface defect detector for IC chip masks. Detects scratches and dusts down to 1μm with 100% accuracy. Features 40x magnification, 460nm blue light, and marble platform. Customizable. ISO certified. Fast 10-min inspection.
Blank Mask Substrate Surface Defect Detector 1μm Resolution 40x Magnification
Detects scratches and dust down to 1μm with 100% accuracy. Features 40x magnification, 460nm blue light, and ≤10 min detection for 350x300mm masks. ISO certified, OEM available, and customizable for process control.
Glass Substrate Surface Defect Detection Equipment 1.8um Resolution 40x Magnification
Detects scratches and dust down to 1μm with 1.8um resolution and 40x magnification. Features blue light illumination and precision motion platform. Customizable for process control and yield management. ISO certified manufacturer with 24-hour response.
Two Axis Surface Defect Detection Equipment 1μm Resolution for Semiconductor Mask Inspection
Detects scratches and dust down to 1μm with 100% accuracy. Features super-resolution imaging, 40x magnification, and X-Y motion platform. Customizable for glass substrate and mask yield management. ISO certified manufacturer with 24-hour support.
Display Panel Surface Defect Detection Equipment 40x Magnification 1μm Resolution
High-precision display panel defect detector with 40x magnification and 1μm detection accuracy. Detects scratches and dust on masks. Features telecentric lens, blue light illumination, and marble platform. ISO certified. Customizable. ≤10 min scan time.