ZEIT Optical Testing Equipment Lamp Reflector Shape Wafer Flatness Surface Defect Detection
Structural Light Large Size Surface Shape Detection Equipment
Applications
Lamp reflector shape detection; wafer flatness detection; car paint surface detection; lens surface shape detection.
Working Principle
The display projects the structured light in stripe form, and the camera collects the structured light from the measured
surface, the collected stripe is deformed through the modulation of the measured surface, the point cloud distribution
and curvature distribution of the measured surface are calculated according to the deformation of the stripe, then the
surface shape error distribution can be obtained by comparing point cloud distribution with ideal model.
Features
| Model | SI200-150 |
| Measuring range | 200×150mm2 |
| Transverse resolution | Conventional 0.25mm, adjustable |
| Measuring precision | Absolute error: ±3μm (100mm in diameter) |
| Note: Customized production available. | |
Detection Image
Our Advantages
We are manufacturer.
Mature process.
Reply within 24 working hours.
Our ISO Certification
Parts Of Our Patents
Parts of Our Awards and Qualifications of R&D
Get in Touch
Have questions about our products or want to discuss a custom order? Our team is ready to help you.