UV Stress Birefringence Measurement System Detection Equipment OEM
Price:
Case by case
MOQ:
1set
Delivery Time:
Case by case
Brand:
ZEIT
Product Description
UV Stress Birefringence Detection Equipment
Applications
| UV-ultraviolet | Semiconductor |
| Light source raw material manufacturer |
Working Principle
In the process of measurement, we can measure the sample in view once to fully master the stress distribution.
Quantize measurement results by two-dimensional charts.
Features
| Model |
SBD-UV-X—X |
| Working mode | Real-time measurement |
| Function | Stress magnitude, stress distribution |
| Detection wave band | VIS-520nm, 590nm, 650nm |
| Test range | 1~110nm& 1~280nm |
| Spatial resolution | 0.05mm |
| Test repeatability | 0.1nm |
| Measurement frequency | >15FPS |
|
Note: Customized production available. |
|
Detection Images
Our Advantages
We are manufacturer.
Mature process.
Reply within 24 working hours.
Our ISO Certification
Parts Of Our Patents
Parts Of Our Awards and Qualifications of R&D
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Get in Touch
Have questions about our products or want to discuss a custom order? Our team is ready to help you.
Company
ZEIT Group
Location
CSCES strait screen and core intelligent manufacturing base，Shuangliu District，Chengdu City, Sichuan Province, P. R. China
Contact Person
Tyra