Wafer Flatness Detection Surface Shape Detection Equipment

Price Negotiable

Price: Case by case

MOQ: 1set

Delivery Time: Case by case

Brand: ZEIT

Product Description

Wafer Structural Light Surface Shape Detection Equipment

Applications

Wafer flatness detection.

Working Principle

The point cloud distribution and curvature distribution of the measured surface are calculated according to the

deformation of the light stripe, and the surface shape error distribution can be obtained by comparing the point

cloud distribution with ideal model.

Features

Model	SSD-W-X—X
Measuring range	200×150mm²
Transverse resolution	Conventional 0.25mm, adjustable
Measuring precision	Absolute error: ±3μm (100mm in diameter)
Note: Customized production available.

Detection Image

Our Advantages

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Parts of Our Patents

Parts of Our Awards and Qualifications of R&D

UV To IR Uniaxial Optical Crystal Sapphire Optical Window 600mm

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Company ZEIT Group

Location CSCES strait screen and core intelligent manufacturing base，Shuangliu District，Chengdu City, Sichuan Province, P. R. China

Contact Person Tyra

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