Test Finger Probe

Unjointed Finger Probe Meets The Requirements of IEC61032 Standard Figure 7 1. Introduction: This Unjointed Finger Probe is made for forceful insertion where the flexibility of the Jointed Finger Probe would be difficult. The Unjointed Finger Probe meets IEC 61032 requirements, Figure 7, Test Probe 11.The Finger Probe may be used to verify the protection of persons against access to hazardous parts, and to verify the mechanical strength of openings in the enclosure or

Test Probe 11 Unjointed Test Finer Probe with 50N Thruster Conforms to IEC61032 1. Introduction of Test Probe 11: The test probe 11 is designed according to IEC61032 figure 7 and UL clauses. This probe may be used to verify the protection of persons against access to hazardous parts, and to verify the mechanical strength of openings in the enclosure or internal barriers. 2. Specification of Unjointed Test Finger Probe: diameter of test finger 12mm Length of test finger 80mm

Children Small Finger Test Probe Kits / IEC61032 Test Probe 19 1. Introduction: Test probe 19 (child small finger probe) is designed according to IEC61032 figure 13. This Probe is intended to simulate access to hazardous parts by children of 36 months or less. 2. Specification Diameter of probe 5.6mm Semi-diameter of probe 2.8mm Length of probe 44mm Diameter of first handle 25.9mm Length of first handle 101.6mm Diameter of second handle 25.4mm Length of second handle 464.3mm

IEC61032 Test Finger Probe Test Probe C Test Rod for IP3X Testing 1. Introduction of Test Probe C: Designed according to IC61032 figure 3, meet the requirements of IEC60529-IP3, IEC60065,IEC60598 and etc. This rod is intended to verify the protection of persons against access to hazardous parts. It is used to verify protection against access with a tool. 2. Specification of Test Probe C: Length of test rod: 100mm Diameter of test rod: 2.5mm Dimater of stop sphere: 35mm

20N / 1N Test Probes According to IEC60884-1 Figure 9 and Figure 10 for Socket - Outlet 1. Introduction of Socket-outlet test probes: The probes are designed according to IEC60884-1 figure 9 and figure 10. 20N test probe is for checking non-accessibility live part through shutters, 1N test probe is for checking non-accessibility live part through shutters and live parts of socket-outlets with increased protection. 2. Parameter of Socket-outlet test probes: 20N Push force

Wedge Probe Designed according to IEC60950 for Paper Shredder Inlet 1. Introduction Wedge probe is designed according to UL60950 figure NAF.2 and NAF.3, IEC60950 and IEC62368 figure V.4, it is for safety test of paper shredder inlet. 2. Application It is applied to test the protection against the slot opening of paper shredder inlet, the probe can not access to the hazardous moving parts. 2. Specification Distance from Probe Tip (mm) Probe Thickness (mm) 0 2 12 4 180 24 3.

IEC61032 Test Finger Probe 2 Diameter 12.5mm Steel Sphere with CNAS Certificate Handle Available 1. Introduction of 12.5mm Steel Sphere: The 12.5mm steel sphere is designed according to IEC61032 figure 6, meet the requirement of IEC60529-IP2. The diameter of sphere is 12.5+0.2, this sphere is intended to verify the degree of protection of enclosures against ingress of solid foreign objects having diameter of 12.5mm or greater. 2. Specification of 12.5mm Steel Sphere: 1).

IEC60335-2-80 Figure 102 Test Pin for Testing the Fan 1. Introduction The test pin is completed designed according to IEC60335-2-80 figure 102, it is to simulate the bolt of fan. The pin is fully inserted so that it connects the down rod to the motor. The fan is supplied at rated voltage and operated at maximum speed. The pin is then partially withdrawn so that the motor is connected to the down rod by that part of the pin having diameter b. The supply to the ceiling fan

ISO17025 Calibrated Test Finger Probe Kits Test IEC61032 Test Probe B Test Probe 12 Test Probe 13 Test Probe 41 The IEC61032 test probe b, test probe 12, test probe 13 and test probe 41 are designed according to IEC61032 standard. All the probes are made of nylon and steel and can be with a third-lab calibration certificate authorized by ISO17025 lab. 1. Introduction of IEC61032 Test Probe B: Jointed test finger (test probe B) is consisted dactylogryposis and handle, the

ISO17025 Approved Test Probe Kits IP Test Finger Probe Packed in Silver Box 1. Introduction: The test probe kits are used to verify the degrees of protection stiulated in IEC60529, includes 50mm test sphere for IP1X testing, jointed test finger probe and 12.5mm test sphere for IP2X testing. 2. Specification Jointed test finger 1). Introduction: Jointed test finger is made according to IEC61032 figure 2, meet the requirements of UL507, UL1278 figure 8 and EN60529 figure 2.

Calibrated Child Small Finger Probe φ8.6mm / Test Probe 18 IEC61032 1. Standard conforms to :IEC61032 figure 12, IEC60335-1, UL1017 and etc. 2. Application: this probe is intended to simulate access to hazardous parts by children of more than 36 months and less than 14 years 3. Application range: Accessible enclosure live parts or mechanical parts 4. Parameters Diameter of probe 8.6mm Semi-diameter probe 4.3mm Length probe 57.9mm Diameter of first handle 38.4mm Length of

IEC61032 Test Probe B / Jointed Test Finger IEC60335-2-14 with Diameter 125 Stop 1. Introduction Jointed test finger (test probe B) is consisted dactylogryposis and handle, the dactylogrypossis has two active joints that can bend in 90 degrees and made by insulating material, the handle can customized with terminals or M6 threaded hole to work with force gauge. Jointed test finger is to protection of person’s finger from hazard parts (Live parts or mechanical parts) of

IEC60950-1 Test Probe Kits (Wedge Probe, Jointed Test Finger, Rigid Test Finger and Test Pin) 1. Introduction The test probe kits are meet the requirement of IEC60950-1, includes jointed test finger, test pin, unjointed test finger, TNV test probe and wedge probe, they are applied to test the person’s protection from live parts and hazardous parts of information technology equipment. 2. Specification Name Figure number Parameter Jointed test finger (test probe B) IEC60950-1

75g Fragmentation Test Hammer with Tungsten Carbide Tip for Glass According to IS015717 1. Introduction The test hammer for fragmentation test having a head with a mass of 75g±5g and a conical tungsten carbide tip with a angle of 60°±2°, it is designed according to IS015717 clause 5.10 and figure 2, IEC60335-2-9, the fragmentation test is be carried out on the glass. 2. Parameter Tip angle 60°±2° Mass 75g±5g Material tungsten carbide Standard ISO15717 clause 5.10 and figure 2

Hardened Steel Pin with Tip Radius R0.25 and 30N Force According to IEC60335-1 clause 21.2 1. Standard Conforms to : IEC60950 clause 2.10.8.4 and IEC60335-1 clause 21.2. 2. Application: Scratch ressitance test for for accessible parts of solid insulation of household appliance and printed circuit boards 3. Introduction ardened steel Pin is designed according to IEC60950 clause 2.10.8.4 and IEC60335-1 clause 21.2. It is applied to do scratch test for accessible parts of solid

Abration Resistance Test Pin Made by Hardened Steel Conforms to IEC60950 1. Introduction The scratch resistance test uses a hardened steel pin for scratching. The end of the steel pin should be tapered with a apex angle of 40°. The tip should be rounded with radius of 0.25 mm ± 0.02 mm. The hardened steel pin should work with abration reistance tester. When performing the scratch test, scratches were performed at a speed of 20 mm/s ± 5 mm/s in a plane perpendicular to the

1mm IP40 Test Probe Wire Equipped with 42V Electrical Indicator IEC60529 1. Standard of IP40 Test Probe Wire IEC61032 and IEC60529 etc. 2. Test Sample of IP40 Test Probe Wire: Easily accessible enclosure live parts or mechanical parts. 3. Introduction of IP40 Test Probe Wire: The IP40 Test Probe Wire is used to verify the protection of persons against access to hazardous parts. Also used to verify the protection against access with a tool. Meets IEC and EN Standards including

PG - TPC IP3X Test Finger Probe Lab Testing Equipment equipped with 42V Electrical Indicator 1. Standard of IP3X Test Finger Probe: IEC61032-1 Figure 3, IEC/EN60529 IP3X, IEC60065, IEC60598 etc. 2. Test Sample of IP3X Test Finger Probe: Easily accessible enclosure live parts or mechanical parts. 3. Introduction of IP3X Test Finger Probe: The IP3X Test Finger Probe is designed according to IC61032 figure 3, meet the requirements of IEC60529-IP3, IEC60065,IEC60598 and etc. This

IEC 60529 IP1X Test Probe equipped with 45V Electrical Indicator and CNAS Calibration Report 1. Introduction of IP1X Test Probe: IP1X Test Probe ( Φ50 sphere with handle) is designed according to IEC61032 fig.1, and meet the requirements of IEC60529 regarding IP1X testing and IEC60065. This probe is intended to verify the protection of persons against access to hazardous parts Test probe A with 50N force is means for the protection of person’s back of hand from hazard parts.

UL1278 IEC 61032 Test Probe B equipped with 42V Electrical Indicator 1. Introduction of IEC61032 Test Probe B: Test probe B ( jointed test finger) is design according to IEC61032 figure 2, meet the requirements of UL507, UL1278 figure 8 and EN60529 figure 2. Test probe B with 50N force is for IP2X testing, it means for the protection of person’s finger from hazard parts. 2. Specification of IEC61032 Test Probe B Diameter of dactylogryposis: 12mm Length of dactylogryposis: