Ultra Scan Head Galvanometer Scanner 10mm Aperture 2D Galvo Scanner
Ultra Scan Head 10/14/20/30/50mm Aperture 2D Galvanometers 14/20/30mm Aperture 3D Galvanometers
Key Features Of UltraScan Head
Ultra Scan Head 10/14/20/30/50mm Aperture 2D Galvanometers 14/20/30mm Aperture 3D Galvanometers
Low noises, high linearity and low drift
Modular design, easy installment and maintenance
Support varieties of F-theta lenses
Available to general protocol (XY2-100) and other protocol
Galvanometer Application
Our scanner systems can process non-metallic and partiaI metallic materials. It is widely used in many industries, such as food packaging, beverage packaging, pharmaceutical packaging, architectural ceramics, buttons, craft gifts, electronic components, mobile phone casings, notebook and flat casing, stripping, film cutting, PCB bar code, shell nameplate, etc.
Technical parameters
| Ultra Scan II | Ultra Scan II 7 |
| Input Beam Aperture (mm) | 7 |
| Beam Displacement (mm) | 9.77 |
| Tracking Error (ms) | 0.15 |
| Repeatability (µrad) | ＜2 |
| Offset Drift (µrad/K) | ＜20 |
| Gain Drift (ppm/K) | ＜100 |
| Long-term drift over 8 hours (mrad) | ＜0.4 |
| 1% Of Full Scale (ms) | 0.22 |
| 10% Of Full Scale (ms) | 0.8 |
| Positioning Speed (m/s) | 25 |
| Typical Scan Angle (°) | ±25 |
| Gain Error (mrad) | <5 |
| Zero Offset (mrad) | <5 |
| Nonlinearity (%) | <0.4 |
| Power Requirements | ±15VDC, ≥3A |
| Communication protocol | XY2-100 |
| Operation Temperature (℃) | 25±10 |
| Weight (kg) | 1.6 |
Scanner Galvanometer in Ophthalmic Imaging
Scanner provides high-speed precision galvanometer control system and solutions. The solutions combined with optical system, based on the principle of weak coherence interference, detect the back-reflection or scattered signals of incident weak coherent light at different depths of biologicaltissue. Through scanning the galvo system can reconstruct the 2D or 3D images of the internalstructure of biological tissue or material.
OCT function: depth measurement for distance; support mirror surface and non-specular measurement without precision loss; support transparent surface measurement; no auxiliary light source required; free from welding laser interference; free from dust and color interference.
Product certificate
Factory environment
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